低压成套开关设备防护等级为IP65时温升试验问题分析

 

张业真

（福建省产品质量检验研究院，福建 福州 350002）

 

    摘 要：低压成套开关设备在满足防护等级IP65 前提下对其进行温升试验，针对试验过程中存在主开关断路器脱扣以及某些温升测量部位温升值超过允许值的现象，结合三次温升试验测试数据结果进行原因分析，提出适当增加排气孔或者利用排气扇进行排气散热，选用开关性能良好以及额定电流比温升试验电流高一个等级，适当提高导线、铜排截面积尺寸等改进措施，来避免问题的再次出现。

    关键词：低压成套开关设备；防护等级；温升试验；改进措施

    中图分类号：TM643     文献标识码：A     文章编号：1007-3175(2018)04-0056-03

    Abstract: The temperature rise test was carried out under the premise meeting the IP65 low-voltage switchgear. In allusion to the phenomenon that the main circuit breaker tripped and the temperature of some measured parts was beyond the permitted value in the test process, combining with three-time temperature rise tests data this paper analyzed the results, proposed to add gas vents or to use fans to carry out breathing and heat dissipation, selected the good switching performance and higher grade ratio of rated current to temperature rise test current, and properly improved the measures of sectional area size of wire and copper bar to avoid the problem reappearing.

    Key words: low-voltage switchgear; ingress protection; temperature rise test; improvement measure